As the foundation and core of electronic information industry, integrated circuit industry is an important pillar and strategic industry of national economy and national defense. Wireless communication, artificial intelligence, automotive electronics, new sensors, and new displays drive the level of integrated circuit design to continue to improve, and bring greater challenges to integrated circuit testing. Due to the overall semiconductor equipment field there are high barriers to technology, capital and industrial collaboration. Compared with foreign enterprises, domestic enterprises entered the field late, and there is a big gap between the overall strength and scale of foreign competitors. However, after years of unremitting catch-up, the technical level of local enterprises has rapidly improved, testing and measurement equipment has grown from scratch, and domestic substitution is imperative.

In this context, CIOE will invite well-known enterprises, experts and scholars from upstream and downstream of the semiconductor testing industry chain to hold the "Integrated Circuit Measurement Technology and Instrument Forum" focusing on the fields of material characterization, nanometrics, defect detection, electrical testing, precision sensing, measurement standards and other fields in integrated circuit manufacturing. Carry out communication and discussion on the basic principles and methods of measurement and testing for integrated circuit manufacturing, key technologies and core devices, measurement standards and measurement technical specifications, measurement system integration and equipment development, etc., to solve the problem of "stuck neck" in the field of integrated circuit testing.